Tapping Mode AFM Probe, Long Cantilever


NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping? mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 ?m). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature. 

This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acuired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Coating Description


Full Technical Data

AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 8 nm (< 12 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 48 N/m (31 - 71 N/m)*
  • Resonance Frequency: 190 kHz (160 - 210 kHz)*
  • Length: 225 ?m (220 - 230 ?m)*
  • Width: 38 ?m (33 - 43 ?m)*
  • Thickness: 7 ?m (6.5 - 7.5 ?m)*