Special Tapping Mode AFM Probe


The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

For owners of the ZEISS Veritekt microscope using the step mode (non-contact mode) we recommend NANOSENSORS? PPP-ZEIHR AFM tips (Zeiss / high force constant). Compared with the PPP-NCH and PPP-NCL AFM probes the force constant is reduced and the resonance frequency is lower.

The probe offers unique features:

  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • high mechanical Q-factor for high sensitivity
  • precise alignment of the cantilever position (within +/- 2 ?m) when used with the Alignment Chip
  • compatible with PointProbe® Plus XY-Alignment Series

Coating Description

The reflex coating is an approximately 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2% of the cantilever length.

Full Technical Data

AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 7 nm (< 10 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 27 N/m (10 - 60 N/m)*
  • Resonance Frequency: 130 kHz (98 - 177 kHz)*
  • Length: 225 ?m (215 - 235 ?m)*
  • Width: 57 ?m (50 - 65 ?m)*
  • Thickness: 5 ?m (4 - 6 ?m)*