Tapping Mode AFM Probe, Long Cantilever


NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping? mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 ?m). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

Coating Description


Full Technical Data

AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 8 nm (< 12 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 48 N/m (31 - 71 N/m)*
  • Resonance Frequency: 190 kHz (160 - 210 kHz)*
  • Length: 225 ?m (220 - 230 ?m)*
  • Width: 38 ?m (33 - 43 ?m)*
  • Thickness: 7 ?m (6.5 - 7.5 ?m)*