Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever
型号:160AC-NA 价格:请致电：010-67529703 品牌:nanoworld
The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated tip offers a sharp tip apex and chemical inertness. The back side aluminum coating significantly enhances the cantilever reflectivity. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.