Tapping Mode AFM Probe with Tip at the Very End of the Cantilever


Optimized positioning through maximized tip visibility

NanoWorld Arrow? NC probes are designed for non-contact or tapping? mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Arrow? series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally, this probe offers an excellent tip radius of curvature.

The unique Arrow? shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Coating Description

Aluminum Reflex Coating 

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Full Technical Data

AFM Tip:

  • Shape: Arrow
  • Height: 10 - 15 ?m
  • Radius: < 10 nm
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 42 N/m (27 - 80 N/m)*
  • Resonance Frequency: 285 kHz (240 - 380 kHz)*
  • Length: 160 ?m (155 - 165 ?m)*
  • Width: 45 ?m (40 - 50 ?m)*
  • Thickness: 4.6 ?m (4.1 - 5.1 ?m)*