Standard Tapping Mode AFM Probe


NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping? mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.
This probe was sold by Veeco Instruments Inc. for over 10 years up until April 2007. Bruker Corporation, which acquired Veeco metrology business, is no longer selling the original probe which has always been manufactured by NanoWorld®.

Coating Description

Aluminum Reflex Coating 

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Full Technical Data

AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 8 nm (< 12 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 42 N/m (21 - 78 N/m)*
  • Resonance Frequency: 320 kHz (250 - 390 kHz)*
  • Length: 125 ?m (120 - 130 ?m)*
  • Width: 30 ?m (25 - 35 ?m)*
  • Thickness: 4 ?m (3.5 - 4.5 ?m)*
  • * typical rangeThis product features alignment grooves on the back side of the holder chip.