Standard Tapping Mode AFM Probe


NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping?  mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this probe offers an excellent tip radius of curvature.

Coating Description

Aluminum Reflex Coating 

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Full Technical Data

AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 8 nm (< 12 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 42 N/m (21 - 78 N/m)*
  • Resonance Frequency: 320 kHz (250 - 390 kHz)*
  • Length: 125 ?m (120 - 130 ?m)*
  • Width: 30 ?m (25 - 35 ?m)*
  • Thickness: 4 ?m (3.5 - 4.5 ?m)*
  • * typical rangeThis product features alignment grooves on the back side of the holder chip.