Tapping Mode AFM Probe with Special Alignment System


The XY-auto-alignment probes for Non-Contact / Tapping mode application (High resonance frequency) with a Reflex coating extend the plug-and-fit alignment concept of the Alignment Chip (ALIGN) to 125 ?m short cantilevers optimized for high speed non-contact / tapping mode applications. Probe exchange with a tip repositioning accuracy of better than ± 8?m is possible for all probes of the XY-alignment probes series – independent of their cantilever length. This series is adjusted to the tip position of probes with a cantilever length of 225?m.

As a matter of course, the features of the proven PointProbe® Plus series such as high application versatility, compatibility with most commercial SPMs, extremely low and reproducible tip radius as well as a precisely defined tip shape are maintained. The excellent tip radius and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

NANOSENSORS? PPP-NCHR AFM probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). This type of AFM probe combines high operation stability with outstanding sensitivity and fast scanning ability.
The probe offers unique features:
  • excellent tip radius of curvature
  • highly doped silicon to dissipate static charge
  • Al coating on detector side of cantilever
  • chemically inert
  • high mechanical Q-factor for high sensitivity
  • tip repositioning accuracy of better than ± 8 ?m (in combination with Alignment Chip)
  • AFM Tip:

  • Shape: Standard
  • Height: 10 - 15 ?m
  • Radius: < 7 nm (< 10 nm guaranteed)
  • AFM Cantilever:

  • Shape: Beam
  • Force Constant: 42 N/m (10 - 130 N/m)*
  • Resonance Frequency: 330 kHz (204 - 497 kHz)*
  • Length: 125 ?m (115 - 135 ?m)*
  • Width: 30 ?m (22.5 - 37.5 ?m)*
  • Thickness: 4 ?m (3 - 5 ?m)*
* guaranteed rangeThis product features alignment grooves on the back side of the holder chip.