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NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping  mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally, this AFM tip offers an excellent tip radius of curvature.