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Standard Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

型号:160AC-NN
价格:请致电：010-67529703
品牌:nanoworld

The 160AC series is designed for standard AC mode AFM imaging in air or vacuum. The uncoated version offers a sharp tip apex, chemical inertness and a high cantilever Quality factor. The tetrahedral tip is located precisely at the free end of the cantilever. This allows the tip to be positioned accurately over the area of interest on the sample surface.

Coating Description

Uncoated

Full Technical Data

AFM Tip:

Shape: OPUS

Height: 14 ?m (12 - 16 ?m)*

Radius: < 7 nm

Half Cone Angle: 0° front, 35° back, <9° side

AFM Cantilever:

Shape: Beam

Force Constant: 26 N/m (8 - 57 N/m)*

Resonance Frequency: 300 kHz (200 - 400 kHz)*

Length: 160 ?m (150 - 170 ?m)*

Width: 40 ?m (38 - 42 ?m)*

Thickness: 4 ?m (3.5 - 4.5 ?m)*